Element Materials Technology will showcase its latest pollution monitoring instrument, the Selective Ion Flow Tube Mass Spectrometry (SIFT-MS), at the ESS Expo 2025. This advanced technology allows real-time detection of low-level organic gases, including PFAS and nitrosamines. These “forever chemicals” are difficult to measure with traditional equipment.
The mobile SIFT-MS device can pinpoint hazardous gases at sites like landfills, wastewater plants, and industrial stacks. It provides continuous, real-time measurements, enabling facilities to identify emissions that are below the detection limits of older monitoring systems. This helps companies meet the increasingly strict environmental regulations.
The technology works by analyzing gas samples in real time, offering immediate data on pollutants such as PFAS, nitrosamines, and other emerging contaminants. Its high sensitivity makes it possible to detect trace levels of pollutants that are critical for compliance with new emission limits.
Element’s SIFT-MS is designed for flexibility and accuracy. It can be used for stack emissions testing, site monitoring, and workplace safety assessments. Its portability allows on-site measurements, reducing the need for laboratory sampling and delays.
The instrument’s ability to monitor for low-level and emerging pollutants represents a significant step forward in environmental monitoring. It enables industries to stay ahead of evolving regulations and reduce risks related to pollutant releases.
Mark Elliott, Technical Manager at Element, emphasized the importance of this technology. “Our SIFT-MS provides a powerful tool for detecting pollutants that were previously difficult to measure. It helps industries ensure compliance, protect communities, and improve safety,” he said.
Element’s ongoing development of its testing capabilities aims to support industries in navigating complex environmental challenges with innovative, real-time solutions.
